The MCI Analytical SEM (Hitachi S3700N) is a large chamber set up with variable pressure that can handle both conductive and non-conductive samples. This SEM has electron dispersive spectrometry (EDS) capabilities along with a µ-XRF source (Bruker XTrace) allowing detection down to 10s parts per million (ppm) with the µ-XRF for specific elements within the SEM. Coupled with the rapid stage attachment, centimeter range µ-XRF mapping can be performed. This SEM also allows cathodoluminescence multispectral imaging (Gatan ChromaCL). These Imaging and X-ray mapping techniques provide information on composition and elemental distribution within objects and can be useful in understanding the origin and history/degradation of materials.