51177
Accession Number
12253
Author
Voillot, C.
Title Of Article Chaper
Scannig electron microscopy and microanalysis in papermaking. (1). The scanning electron
Title Of Journal Book
Revue ATIP
Volume
36
Issue
4
Pages
160 167-174 177-179 268279-303
Collation
Table, 10 figs., 35 illus.
Language Of Text
French
Language Of Summary
English
Literature Type
Serial
Literature Level
Analytic
Abstract
The scanning electron microscope and its operations are described, and papermaking applications involving the use of secondary and rediffused electrons in forming topographic images are presented. The use of a bundle of electrons to bombard an object produces not only topographic contrasts but also chemical contrasts. The possibilities of using these chemical contrasts for microanalysis in the pulp and paper industry are discussed. Both the x-ray spectrometer with energy selection and instruments for detecting rediffused electrons are described, and their applications are illustrated by photographs of surfaces and sections of the paper being analyzed, x-ray mapping, and concentration profile. -- AATA
pub_id
51177
Title Translation
Microscope (SEM). (2). Microanalysis