50822
Accession Number
10543
Title Of Article Chaper
X-ray photoelectron spectroscopy: a new analytical method for the examination of archaeological artifacts
Title Of Journal Book
Archaeometry
Volume
18
Issue
2
Pages
169-180
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Abstract
X-ray photoelectron spectroscopy (xps) is used to analyze artifact composition. Qualitative analysis data is presented on glass, pottery, metal, bone, and stone. This technique is applicable to the qualitative and quantitative chemical analysis of artifacts.
Keywords
Spectroscopy, x ray photoelectron xps; Archaeology, artifact excavation analysis; Glass, analysis elemental; Bronze, analysis; Metal, analysis; Ceramic, analysis elemental; Bone, analysis; Stone, analysis elemental ICCROM
pub_id
50822