The quantitative analysis of glass, ceramics and related silicate systems by means of energy dispersive x-ray fluorescence spectrometry is considered and problems arising from the selective absorption of x-rays in multi-element specimens are discussed. A computer program written in FORTRAN and based upon a semifundamental parameters approach to the correction of matrix effects in glass and chemically similar materials is fully described. Model data are pro vided to enable the program to be ran and tested. An empirical coefficients computer program for the quantitative analysis of silicate systems is outlined and the limitations of this type of program are pointed out. The importance of adequate sample preparation prior to x-ray spectrometric analysis is stressed.