45670
Accession Number
39054
Author
Lee, Fred;Van Teylingen, Cees
Title Of Journal Book
VIEEW[trademark]: A Quantum Leap in the Advancement of Surface Defect Evaluation
Collation
5 p. : ills.
Language Of Text
English
Literature Type
Unpublished
Literature Level
Monographic
Keywords
surface;defect;evaluation;analysis;optical;imaging;illumination;digital;image
pub_id
45670
Issue Date
20020000?