Four sensitive methods of surface analysis are described and their performances compared. The methods are Auger electron spectroscopy (AES), photoelectron spectroscopy (ESCA), secondary ion mass spectrometry (SIMS), and ion scattering spectroscopy (ISS). The problems of obtaining quantitative surface analyses are discussed for each method. The application of the methods in silicate glass technology are illustrated with respect to three current areas of interest namely surface compositions, surface coatings, and glass stability.