43994
Accession Number
16989
Author
Kotsis, K.T.; Alexandropoulos, N.G.
Title Of Article Chaper
A source of spurious peaks in a multi-crystal xray spectrometer
Title Of Journal Book
Journal of physics
Volume
20
Issue
1
Collation
figures
Reference Bibliography
Bibliography: p. 75-76
Literature Type
Serial
Literature Level
Analytic
Abstract
It is demonstrated that, under certain conditions, the spectrum of a monochromatic xray beam analysed by a multicrystal spectrometer includes several spurious peaks. These erroneous peaks are the result of the angular separation of dynamically and kinematically diffracted radiation. The above separation of the diffracted radiation occurs when the diffraction takes place near, instead of on, a reciprocal lattice point, at one of the spectrometer's crystals.
Keywords
multi-crystal xray spectrometer
pub_id
43994