43336
Title Of Article Chaper
Part II. PIXE-Analysis of <i><b>Klippen</i></b> and coins from Bonn and Jülich
Title Of Journal Book
Proceedings of the 18th international symposium on archaeometry and archaeological prospection, Bonn, 14-17 March 1978
Pages
348-359
Collation
Plate, 5 figs, 2 tables
Reference Bibliography
Includes 4 bibliog. refs.
Publisher
Rheinland-Verlag GmbH
Publisher City
Köln
Language Of Text
English
Literature Type
Monograph
Literature Level
Analytic
Meeting
International symposium on archaeometry and archaeological prospection. 18.
Meeting City
Bonn
Abstract
The elemenal analysis of the <i>Bonner Klippen</i> is one of the first applications of a method for bulk analysis using x-ray fluorescence excited by high energy projectiles, the PIXE (particle induced x-ray emission) method. The advantages of this bulk analysis especially for archaeometric purposes -- its accuracy and its sensitivity -- are domonstrated as well as its limitations. The analyses are done with the Ã8-particle beam of the Bonn University isochronous cyclotron with an energy of 30 MeV. The results of the investigation of the <i>klippen</i> and some coins from the same time are persented. One of the nine <i>klippen</i> analyzed is clearly seen to be a forgery and the authenticity of two more is doubtful. See also AATA-23-2941 for historical background of the <i>klippen</i>.
Keywords
Coin, authenticity forgery; Coin, silver; Spectroscopy, emission x ray proton-induced pixe -- ICCROM
pub_id
43336
Meeting Date
19780314-19780317