This magazine is a special issue by Siemens on the topic of X- Ray and Electron Microscopy. Articles are on the following topics: structural order and disorder in tungsten oxides; composition analysis of solid solutions by X-ray techniques; determination of PPM chlorine in selenium base; program for an automated X-ray spectrometer; measurement of stress in brass; lattice imaging; dynamic high-temperature X-ray diffraction; X-ray fluorescence equipment; and a vacuum path for a diffractometer.