42153
Accession Number
18889
Title Of Article Chaper
Physical surface analysis methods (ESCA, AES, SIMS) in the study and control of surface treatments
Title Of Journal Book
Surfaces
Volume
23
Issue
168
Pages
30-35
Collation
14 refs.
Language Of Text
French
Literature Type
Serial
Literature Level
Analytic
Abstract
The use of electron spectroscopy for chemical analysis, Auger electron spectroscopy, and secondary ion mass spectroscopy to study surface treatments on metals is described. -- AATA
Keywords
Metal surface treatment examination;Electron spectroscopy for chemical analysis;Auger electron spectroscopy;Secondary ion mass spectroscopy AATA
pub_id
42153