41959
Accession Number
22039
Author
Forster, Frances G.; Burgess, William A.
Editor
Goodfellow, Howard D.
Title Of Article Chaper
The evaulation of gas cabinents used in the semiconductor industry
Title Of Journal Book
Ventilation '85. Proceedings of the 1st International Symposium on Ventilation for Contaminant Control, October 1-3, 1985, Toronto, Canada
Pages
175-191
Collation
17 p. : ills., 1 table, 10 figs.
Reference Bibliography
Includes bibliographical references
Publisher
Elsevier Science Publishing Company Inc.
Publisher City
New York
Language Of Text
English
Literature Type
Monograph
Literature Level
Analytic
Meeting
Proceedings of the 1st International Symposium on Ventilation for Contaminant Control
Meeting City
Toronto
Meeting Country
Canada
Abstract
Gas cabinents are widely used in the semiconductor industry but no evaluation of their performance has been published. This paper describes a technique for testing the performance of these cabinets, and for defining the optimum geometry and exhaust rate. A test protocol was developed that allows one to evaluate the cabinet's ability to remove leaking gas with clearance time used as the critical variable. The test results for a two cylinder gas cabinet indicate that the diffuser and perforated plate inlets perform significantly better than the conventional slotted inlet under all conditions tested. Clearance time for all inlet configurations improves markedly when the flow rate is increased from 0.07 to 0.12 m* h3*s/s (150 to 250 cfm), but little improvement is seen for the diffuser and perforated plate when the flow rate is increased further to 0.17 m<sup>3</sup>/s (350cfm). Finally, changes in the exhaust configuration had no meaningful effect on clearance time.
Keywords
gas cabinents;semiconductor industry
pub_id
41959
Meeting Date
19851001-19851003