40839
Accession Number
9573
Title Of Article Chaper
The localization of impurities in activation analysis demonstrated by analysis of semiconductor silicon
Title Of Journal Book
Preprints: The 1968 International Conference on Modern Trends In Activation Analysis, no. 54
Pages
400-411
Reference Bibliography
Includes bibliographical references
Language Of Text
English
Literature Type
Monograph
Literature Level
Analytic
Meeting
1968 International Conference on Modern Trends in Activation Analysis
pub_id
40839
Meeting Date
19680000