40280
Accession Number
12357
Editor
Vandiver, Pamela B.; Druzik, James R.; Galván Madrid, José Luis; Freestone, Ian C.; Wheeler, George Segan
Title Of Article Chaper
Microdots as a means of marking and tracking artifacts
Title Of Journal Book
Materials issues in art and archaeology IV: symposium held May 16-21, 1994, Cancun, Mexico
Volume
352
Pages
181-186
Collation
4 figs.
Publisher
Materials Research Society
Publisher City
Pittsburgh
ISBN
1-55899-252-9
ISSN
0272-9172
Language Of Text
English
Language Of Summary
English
Literature Type
Monograph
Literature Level
Analytic
Meeting
Materials Research Society Symposium
Meeting City
Cancun
Abstract
Scanning electron microscopy with simultaneous energy dispersive x-ray analysis was used to charaterize microdots to assess their suitability for the identification and tracking of artifacts. They were found comparable to commercial state-of-the-art microfilm and microfiche which are known to be durable for about 20 years without postprocessing treatment to stabilize them. -- CAL
Keywords
microdot; mark; track; artifact; SEM; EDS -- CAL
pub_id
40280
Meeting Date
19940516-19940521