39763
Accession Number
12076
Title Of Article Chaper
Surface analysis: selecting a technique and an instrument
Title Of Journal Book
Industrial research and development
Volume
23
Issue
8
Pages
112-115
Literature Type
Serial
Literature Level
Analytic
Abstract
The type of physical and chemical information obtainable from x-ray photoelectron spectroscopy, secondary ion mass spectroscopy and ion scattering spectroscopy is tabulated, together with applications for the techniques. -- AATA
pub_id
39763