38449
Accession Number
32484
Author
Doehne, E.; Stulik, D.C.
Author Affiliation
The Getty Conservation Institute
Title Of Article Chaper
Applications of the environmental scanning electron microscope to conservation science
Title Of Journal Book
Scanning microscopy
Volume
4
Issue
2
Pages
275-286
Collation
1 table, 1 fig., 30 scanning electron micrographs
Reference Bibliography
15 refs.
ISSN
0891-7035
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Abstract
The environmental scanning electron microscope (E-SEM) provides electron imaging at relatively high sample pressure, with imaging and analysis capabilities comparable to those of traditional high vacuum SEM. Several case studies demonstrate the advantages and research potential of this new technology as applied to conservation science: 1) dynamic study of wetting and drying of consolidated and unconsolidated adobe samples; 2) semidynamic study of lead corrosion as a result of exposure to formaldehyde; 3) electron imaging of outgassing sample parchment; 4) study of uncoated, nonconductive samples, e. g., swabs from Sistine Chapel cleaning; 5) x-ray analysis of uncoated insulators, e.g., gold and garnet jewelry. The environmental scanning electron microscope offers unique capabilities for dynamic experiments, imaging of outgassing samples and insulators, which may be applied to the study of deterioration mechanisms, material treatments, and ancient materials and technologies. Includes discussion with reviews.
Keywords
scanning electron microscopy;conservation science; environmental scanning electron microscopy;imaging;adobe;lead corrosion; formaldehyde; parchment;Sistine Chapel (Vatican);cleaning;radiography; gold;garnet;jewelry; deterioration
pub_id
38449