38231
Accession Number
9646
Title Of Article Chaper
Charged Particle Activation Analysis For Carbon, Nitrogen, And Oxygen In Semiconductor Silicon
Title Of Journal Book
Preprints: The 1968 International Conference on Modern Trends in Activation Analysis
Pages
930-935
Reference Bibliography
Includes bibliographical references
Language Of Text
English
Literature Type
Monograph
Literature Level
Analytic
Meeting
The 1968 International Conference on Modern Trends in Activation Analysis
Abstract
This article undertakes to establish conventional processes for quantitative determination and analyzes semiconductor silicons of various origins. The article describes the processes and results.
Keywords
irradiation;nuclear;activation;analysis
pub_id
38231
Meeting Date
19680000