30464
Accession Number
24421
Author
Dorn, Ronald I.; Cahill, Thomas A.; Eldred, Robert A.; Gill, Thomas E.; Kusko, Bruce H.; Bach, Andrew J.; Elliott-Fisk, Deborah L.
Editor
Morita, S.; Cahill, T.A.; Johansson, S.A.E.; Uda, M.
Author Affiliation
Arizona State University. Department of Geography;University of California. Crocker Nuclear Laboratory;University of California. Crocker Nuclear Laboratory; University of California. Crocker Nuclear Laboratory;University of California. Crocker Nuclear Lab
Title Of Article Chaper
Dating Rock Varnishes by the Cation Ratio Method with PIXE, ICP, and the Electron Microprobe
Title Of Journal Book
International Journal of PIXE
Volume
1
Issue
2
Pages
157-195
Collation
39 p. : ill.
Reference Bibliography
Includes bibliographical references
Publisher
World Scientific Publishing Company
ISSN
0129-0835
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Abstract
The measurement of rock varnish cation-ratios ((K+Ca)/Ti) and barium is evaluated by analyzing the same varnish scrapings with PIXE, inductively coupled plasma, neutron activation and wavelength dispersive electron microprobe. Results among these different methods are generally similar for ratios, but absolute concentrations differ in part due to uncertainties associated with weighing small samples. Barium concentrations are typically less than 1per thousand by weight; higher concentrations can be found in varnishes with depressions eroded into the varnish by fungi and lichens, and later infilled with aeolian detritus often including barium sulfate. Since these infilled hollows are known to produce anomalous varnish cation ratios, high barium values can, therefore, be used as an indicator that a sample is inappropriate for cation-ratio dating. The glacial chronology at Pine Creek, California, is revised in light of new data and a better understanding of variables influencing varnish chemistry.
Keywords
rock varnish;cation-ratio dating;PIXE;geochronology;Sierra Nevada; moraines;dating;rock;varnish;ICP;electron microprobe
pub_id
30464