30180
Accession Number
30958
Author
Dussubieux, Laure; Pinchin, Sarah Eleni; Tsang, Jia-sun; Tumosa, Charles S.
Author Affiliation
Smithsonian Center for Materials Research and Education; Smithsonian Center for Materials Research and Education; Smithsonian Center for Materials Research and Education; Smithsonian Center for Materials Research and Education
Title Of Article Chaper
Non-destructive elemental analysis:reliability of a portable X-ray fluorescence spectrometer for museum applications
Title Of Journal Book
Preprints of the 14th Triennial Meeting, The Hague, 12-16 September 2005
Volume
2
Pages
766-773
Collation
8 p. : ills.
Reference Bibliography
Includes bibliographic references
Publisher
ICOM-CC
Language Of Text
English
Literature Type
Monograph
Literature Level
Analytic
Abstract
X-ray fluorescence spectroscopy (XRF) is a common analytical technique found in many laboratories. The instrumentation for this technique is rather large and does not lend itself to on-site examinations. Recent innovation in solid-state technology make portable instruments available that can be used outside the laboratory in museum galleries or at archaeological sites. The use of such an instrument, however, has practical limitations that are different from laboratory models. This study relates experience with an Innov-X Systems portable X-ray fluorescence spectrum analyzer and examines the practical limits of analysis done with that system. Selected glass, gold, and bronze objects from museum collections as well as standards and materials previously analysed using inductively coupled plasma mass spectroscopy with laser ablation (LA-ICP-MS) were used in these tests. This study was meant not to present the theoretical limitations of XRF but to document the practical concerns of on-site XRF testing.
Keywords
xrf; non-destructive; analysis; glass; metal; gold; bronze; paint; icp; icp-ms
pub_id
30180