This section covers: Agilent – New technique combines SECM and AFM to enhance research capabilities; Asylum Research: an Oxford Instruments Company – Scanning Microwave Impedance Microscopy (sMIM) for High Resolution Electrical Characterization; Bruker Nano Surfaces – Performing sub-molecular imaging of the DNA double helix with PeakForce Tapping; Park Systems – Innovative 3D AFM Technology for High Resolution Sidewall Imaging; and, WITec – Nearfield-Raman – Imaging beyond the diffraction limit.