Laser surface profilometry (LSP) is a new, non-destructive method for determining the surface topographical features of materials. By focusing a diffraction-limited spot of a specially configured laser onto the surface of interest, the distance from the object to the laser can be determined to a nanometer resolution. By combining the laser height measurement with a three-dimensional (x-y-z) computer-controlled linear-motion system for moving the sample, a detailed raster image of the surface can be obtained. This method offers significant advantages over conventional methods of imaging such as scanning electron microscopy and optical microscopy. LSP has a large depth of field, 800 mm, with a resolution in the z direction of 5 nm and in the x and y directions of 100 nm. No sample preparation is necessary and objects can be examined in ambient laboratory conditions. Any type of sample can be imaged so long as the surface reflects at least 2 percent of the light at the laser wavelength of 780 nm.