27959
Accession Number
3286
Author
Klingele, H.; Weigl, J.
Title Of Article Chaper
Raster-Elektronenmikroskopie Moeglichkeiten der Papierbeurteilung
Title Of Journal Book
Wochenblatt fuer Papierfabrikation
Pages
197-204
Literature Type
Serial
Literature Level
Analytic
Abstract
The scanning electron microscope can give us the shape factor of the size particles and their orientation. The authors describe the apparatus and the technique. The x-rays present a Roentgen spectrum of the constituent elements and impurities. Figures show glazing and the binder. The migration phenomenon can also be studied. -- AATA
pub_id
27959
Title Translation
The possibilities of paper characterization by scanning electron micro-scopy