26497
Accession Number
29070
Author
Mantler, M.; Schreiner, M.; Weber, F.; Ebner, R.; Mairinger, F.
Author Affiliation
Technical University. Institute of Applied and Technical Physics; Academy of Fine Arts. Institute of Chemistry; Technical University. Institute of Applied and Technical Physics; Technical University. Institute of Applied and Technical Physics; Academy of
Title Of Article Chaper
An X-Ray Spectrometer for Pixel Analysis of Art Objects
Title Of Journal Book
Advances in X-Ray Analysis
Volume
35
Pages
987-993
Collation
7 p. : ill.
Reference Bibliography
Includes bibliographical references
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Abstract
An x-ray spectrometer has been designed for pixel by pixel analysis along lines or across selected areas of paintings and other art-objects. Characteristic technical data are: 0.8mm<sup>2</sup> pixel size, 800mm (vert.) by 1000mm (horiz.) by 200 mm (perpendicularly to object) motion distances, ±20mum precision in positioning the system, 2x3m maximum object size (mounted vertically); 2.8kW x-ray tube; Si(Li) detector. PC's are used for instrument control and new, complex data evaulation software.
Keywords
x-ray; spectrometer; pixel; art
pub_id
26497