23803
Accession Number
15213
Title Of Article Chaper
Measuring polymer film thickness by interference patterns
Title Of Journal Book
Journal of chemical education
Volume
61
Issue
5
Pages
439
Collation
2 refs.
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Abstract
This note corrects an error in a paper by other authors in the Journal. The equation relating thickness of a film (d) and interference patterns of infrared radiation is given: d= m 2n(V<sub>1</sub>-V<sub>2</sub>) where m is the number of peak maxima between measured interference peaks; n is the refractive index of the polymer; and V is the wave-number. When using two adjacent peak maxima, m=1, and the equation becomes d= 1 2n(DELTA...) where d is in centimeters. -- AATA
pub_id
23803