23429
Accession Number
28241
Author
Tláskal, Jaroslav;Veselá, Alena
Editor
Novák, Antonin
Author Affiliation
AHVT;AHVT
Title Of Article Chaper
Rastrovaci elektronová mikroskopie a lokálni analýza (REM) = Electron Scanner (REM) and Local Analysis
Title Of Journal Book
Technologia Artis: Rocenka Archivu Historické Výtvarné Technologie Praha = Yearbook of the Archives of Historical Art Technology Prague
Volume
2
Pages
144-146
Collation
3 p. : ill.
Reference Bibliography
Includes bibliographical references
Publisher
OBELISK
Publisher City
Prague
ISBN
8090017150
Language Of Text
Czech;English
Literature Type
Monograph
Literature Level
Analytic
Abstract
Electron scanning (REM) in combination with local analysis is one of the modern non-destructive characterisation methods which are used in particular in material investigative research. These methods have not been used extensively so far in Czechoslovakia for the investigation of historical art objects, perhaps because they are relatively expensive. The aim of this report is a brief description of their principle and a demonstration of theit possibilities through come of the results acquired in the investagative research of five panel paintings by MAster Theodoric.
Keywords
electron;scanner;REM;analysis
pub_id
23429