Coatings and coating defects are analyzed and characterized with light and scanning (SEM) and transmission (TEM) electron microscopy. Microscopy is used in conjunction with other instruments, such as the x-ray energy spectroscope (XES). A series of photomicrographs are discussed which illustrate various analytical techniques and coating defects. For example, phosphated steel panels were analyzed with both SEM, which demonstrated surface defects, and XES, which demonstrated any elemental differences.