23614
Accession Number
38003
Author
Williams, John
Title Of Article Chaper
The Dual-Beam – Its Birth, Progress, and Future
Title Of Journal Book
Microscopy Today
Volume
22
Issue
4
Pages
32, 34-36
Collation
4 p. : ills.
Reference Bibliography
Includes bibliographic references
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Keywords
technology;ion;beam;focused;fib;sem;scanning;electron;microscopy;tem;analysis;transmission;visualization;3d;nanotechnology
pub_id
23614