18572
Accession Number
8456
Author
Ehrlich, Gert
Title Of Article Chaper
Wandering surface atoms and the field ion microscope
Title Of Journal Book
Physics today
Volume
34
Issue
6
Pages
44-53
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Abstract
A description of the field ion microscope and its ability to prepare surfaces smooth at the atomic level and to provide quantitative data about surface behavior on that level. The resolution is a few angstroms. By superimposing two images, or imaging at a reduced field, the positions of adatoms on the surface of metals and semiconductors can be studied. -- AATA
pub_id
18572