17217
Accession Number
4404
Title Of Article Chaper
Observing Strain Birefringence in Silicon Devices by Infrared Microscopy
Title Of Journal Book
Research Devices, Inc. Technical Bulletin
Issue
4
Collation
2 p. : ills., 5 figs.
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
pub_id
17217