A vacuum path diffractometer kit for the Siemens diffractometer with Omega drive is described. The entire X-ray beam path is maintained inside the vacuum perimeter. The authors obtained X-ray traces from several samples first by using the normal air path and then by retracing the same peak on the same scale with the vacuum path. It is observed that the vacuum path yields an intensity increase of about three times in each case. The vacuum path diffractometer extends the range of analysis for thin films. It will also aid in phase identification of ceramics and crystallized glasses by spreading out the complex X-ray traces and thus eliminating some of the peak overlay.