12422
Author
Barnard, J.A.W.; Polk, D.E.; Giessen, B.C.
Title Of Article Chaper
Forensic identification of papers by elemental analysis using Scanning Electron Microscopy
Title Of Journal Book
Scanning Electron Microscopy/1975/Part II
Pages
5 19-520
Collation
5 figs.,,2 tables,,10 refs., discussion with reviewers
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Abstract
The usefulness of elemental analysis for the characterization of paper for forensic purposes had been demonstrated previously using neutron activation analysis (NAA). In the present study, the applicability of SEM x-ray microanalysis to the identification of elements contained in the minerals which are added to papers as filters, coatings and pigments is shown. Individualized particles near the surface of the paper have been examined and analyzed. The advantage of analyzing paper samples after ashing is demonstrated. Comparison spectra from smaller areas has demonstrated that R5 in. disc of the paper is generally sufficient to produce a representative spectrum. In a reproducibility study the variations within a sheet and within a box of paper as well as the variation between two batches of this paper were determined. Fifty-four different samples of paper have been analyzed, and their spectra are reported. The SEM x-ray microanalysis can aid in distinguishing papers since the compositional variation within the sampled population is much greater than that found to exist within a single box. -- AATA
pub_id
12422