10781
Title Of Article Chaper
Review of the recent applications of high energy microprobes in art and archaeology
Title Of Journal Book
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms
Pages
334-345
Collation
4 figs., 1 table
Reference Bibliography
99 refs.
ISSN
0168-583X
Language Of Text
English
Language Of Summary
English
Literature Type
Serial
Literature Level
Analytic
Abstract
New improvements are reviewed in design and use of high energy on beams for examination of fragile and unique materials encountered in art and archaeology. Laboratories worldwide involved in archaeological research are tabulated. Most investigations are performed with particle-induced x-ray emission (PIXE) alone or in combination with atomic absorption spectrometry (AAS), x-ray fluorescence (XRF), scanning electron microscopy (SEM), electron probe x-ray microanalysis (EPMA), neutron activation analysis (NAA), FNAA, CPAA, particle induced gamma-ray emission (PIGE), and Rutherford backscattering spectrometry (RBS). Lack of homogeneity in artifacts is probably the greatest difficulty encountered. Irradiation in a vacuum may cause damage, e.g., halos of discoloration on paint layers, glass, ceramics, and bronzes, changes in brightness and tensile strength of papers, and possible damage due to increased temperature upon irradation. Applications of microprobe analyses published mainly in the last three years are reviewed test objects include paper, parchments, bones, paintings, ceramics, glasses, and metals. Milliprobes (1-2 mum diam.) are often sufficient for multielemental analyses of potsherds, glasses, and uncorroded metals when comparisons are to be made with basic materials presumably used in their manufacture. Miniprobes (a few 100s mum diam.) are more generally used for papers, documents and their inks, and colored illustrations. Microprobes (10 mum and less diam.) are useful for identifying inclusions in metals and glasses and for understanding workmanship of goldsmiths.
Keywords
microprobes;ion beam analysis; particle-induced x-ray emission analysis; atomic absorption spectrometry; x-ray fluorescence;scanning electron microscopy; NAA;PIGE;backscattering
pub_id
10781