10544
Title Of Article Chaper
Summary of the results of analysis of obsidian artifacts from the Maya lowlands
Title Of Journal Book
Scanning electron microscopy
Volume
1985
Issue
2
Pages
631-649
Collation
7 figures, 15 tables, 60 refs.
ISSN
0586-5581
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Abstract
X-ray spectrometry was used to analyze obsidian artifacts from Cerros, Belize, and from Yaxchilan, Chiapas, Mexico. The results of these analyses are compared to the results of analysis of obsidian geological sources using graphical and statistical methods in order to identify the probable source from which the obsidian for the artifacts came. These results are summarized along with the results of analysis by others of obsidian artifacts from several archaeological sites in the Lowland Maya area. Using these data, possible trade routes, and how they may have changed through time have been postulated. -- AATA
Keywords
x-ray spectrometry;obsidian;Maya exchange routes;obsidian trads;Maya archaeology;Cerros, Belize;Yaxchilan, Chiapas;Mesoamerican archaeology AATA
pub_id
10544