Long-wavelength ( soft ) x-rays are in the region of the electromagnetic spectrum between ultraviolet radiation and short-wavelength ( hard ) x-rays. In recent years, synchrotron particle accelerators have provided an intense source of soft x-rays. Contact x-ray microscopy and scanning x-ray microscopy are being attempted, and this article reviews the progress and goals of these new techniques, which would provide greater penetration, though less resolution, than transmission electron microscopy without requiring that the specimens be stained and mounted in a vacuum chamber. -- AATA