7980
Title Of Article Chaper
The microtopography of pencil lead in drawings
Title Of Journal Book
Postprints from the AIC tenth annual meeting, Milwaukee, Wisconsin, 26-30 May, 1982
Pages
110-113
Publisher
American Institute for Conservation
Publisher City
Washington
Language Of Text
English
Literature Type
Monograph
Literature Level
Analytic
Meeting
Annual meeting of the AIC,. 10.
Meeting City
Milwaukee, Wisconsin
Abstract
In this summary of a paper published in the Papers Presented at the Art Conservation Training Programs Conference, April 28-29 1980, (see also AATA 18-296) University of Delaware, Newman tries to establish criteria by which natural and synthetic pencil leads can be distinguished from one another on the basis of their microtopography. He begins his paper with a history of the use of natural graphite pencils and the invention of synthetic pencils. He then discusses the morphological distinctions of natural and synthetic pencil leads -- which become clear at magnifications obtainable only with a scanning electron microscope -- and describes the procedure for taking a sample for a SEM study.
Keywords
Drawing, pencil; lead, examination test; lead, analysis -- ICCROM
pub_id
7980
Meeting Date
19820526-19820530