Proton-Induced-X-ray Emission (PIXE) has been proven to be a very rapid and accurate methods for the elemental analysis of gold artifacts. Using protons whose energy is close to 3 MEV, it is possible to obtain, in less than 10 minutes, the actual composition (copper, iron, gold, silver) of narrow parts (.5 mm2) of artifacts, without any sampling even at microscopic level. The energy of the protons is so low that no residual activity is induced. We discuss how to improve the sensitivity for the analysis of all elemnts other than gold; how to avoid interferences of x-ray lines of neighboring energy by using complimetary Ge and Si(Li) detectors; how to calculate the actual background under the charactersitic x-ray peaks; how to correct the measured x-ray intensities to obtain the accurate concentrations using a known reference material whose composition can be very different from that of the sample to be analyzed; how to take into account the secondary fluorescent yield mainly from gold x-ray lines in the copper of the alloy.