4479
Accession Number
696
Author
Craig, R.D.; Wolstenholme, W.A.
Title Of Article Chaper
Determination of impurities in solids by mass spectrometry
Title Of Journal Book
Industrie Chimique Belge
Volume
29
Collation
15 p. : ills., 14 figs., 7 tables
Reference Bibliography
Includes bibliog. refs.
Language Of Text
English
Literature Type
Serial
Literature Level
Analytic
Abstract
Solid source mass spectrometry is increasingly widely being used for impurity analysis in materials research. Special advantages are its high sensitivity (1 part in 10<sup>9</sup>), approximate equality of sensitivity for all elements, simplicity of interpretation, overall coverage of the elements in a single analysis and ease of adaptation to new problems. A brief description of the type of mass spectrometer required for such analysis is given and the basic features of the spectra obtained using spark and arc type ion sources are discussed. The method of making an analysis is described in detail and examples are given of applications and results in metallurgy, solid state physics, reactor technology and inorganic chemistry.
pub_id
4479