3439
Author
Humphreys, F.J.
Editor
Doig, P.
Title Of Article Chaper
The determination of texture in the electron microscope
Title Of Journal Book
Electron microscopy and analysis, 1983: proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference held at the University of Guildford, 30 August-2 September 1983 (EMAG 83)
Pages
283-288
Collation
4 figs.
Reference Bibliography
14 refs.
Publisher
Institute of Physics (Great Britain)
Publisher City
Bristol
ISBN
854981594
Language Of Text
English
Literature Type
Monograph : Proceedings
Literature Level
Analytic
Abstract
The distribution of orientation, or texture, of a bulk sample is most readily determined by x-ray or neutron diffraction analysis. However, for inhomogeneously deformed or partly recrystallized material, it is often important to obtain such information from small regions of the sample, and in this case, electron beam techniques are used. The texture is usually measured by determining the orientations of many individual crystallites and then constructing a pole figure, inverse pole figure, or orientation distribution function.
Keywords
texture;electron microscopy
pub_id
3439