3019
Accession Number
28900
Author
Bower, N.; Radamacher, D.; Shimotake, T.; Anselmi, T.; Peckham, S.
Editor
Farquhar, R.M.; Hancock, R.G.V.; Pavlish, L.A.
Title Of Article Chaper
A Pattern recognition and scanning electron microscope with x-ray fluorescence analysis of glaze-paint Anasazi pottery from the American Southwest
Title Of Journal Book
Proceedings of the 26th International Archaeometry Symposium: held at University of Toronto, Toronto, Canada, May 16th to May 20th, 1988
Pages
204-209
Collation
2 tables, 2 figs.
Reference Bibliography
Includes refs.
Publisher
University of Toronto. Archaeometry Laboratory
Publisher City
Toronto
ISBN
0-921956-00-2
Language Of Text
English
Language Of Summary
English
Literature Type
Monograph : Proceedings
Literature Level
Analytic
Meeting
International Archaeometry Symposium (26th : 1988 : University of Toronto)
Meeting City
University of Toronto
Abstract
SEM-XRF is used to provide a simple, nondestructive, surface elemental analysis of Anasazi pottery. After employing various clustering methods, conclusions about the provenance and materials of manufacture are made.
pub_id
3019
Meeting Date
19880000