734
Accession Number
11369
Title Of Article Chaper
Dating of obsidian artifacts by depth-profiling of artificially hydrated surface layers
Title Of Journal Book
Nuclear instruments and methods in physics research
Volume
191
Issue
44199
Pages
403-407
Literature Type
Serial
Literature Level
Analytic
Abstract
Fresh surfaces of obsidians are hydrated in the laboratory and the thicknesses of the hydrated layers are determined by hydrogen depth-profiling using secondary ion mass spectrometry and <sub>19</sub>F nuclear reaction. It appears feasible to establish a hydration equation which will allow obsidian artifacts to be independently dated by their hydrated depths. However, it is important to operate in hydration time and temperature regimes in which dissolution of the obsidian surface can be avoided. -- AATA
pub_id
734